Resumen
Recent years have seen a rapid increase in research activity in the field of DRAM-based Processing-In-Memory (PIM) accelerators, where the analog computing capability of DRAM is employed by minimally changing the inherent structure of DRAM peripherals to accelerate various data-centric applications. Several DRAM-based PIM accelerators for Convolutional Neural Networks (CNNs) have also been reported. Among these, the accelerators leveraging in-DRAM stochastic arithmetic have shown manifold improvements in processing latency and throughput, due to the ability of stochastic arithmetic to convert multiplications into simple bit-wise logical AND operations. However, the use of in-DRAM stochastic arithmetic for CNN acceleration requires frequent stochastic to binary number conversions. For that, prior works employ full adder-based or serial counter-based in-DRAM circuits. These circuits consume large area and incur long latency. Their in-DRAM implementations also require heavy modifications in DRAM peripherals, which significantly diminishes the benefits of using stochastic arithmetic in these accelerators. To address these shortcomings, this paper presents a new substrate for in-DRAM stochastic-to-binary number conversion called AGNI. AGNI makes minor modifications in DRAM peripherals using pass transistors, capacitors, encoders, and charge pumps, and re-purposes the sense amplifiers as voltage comparators, to enable in-situ binary conversion of input statistic operands of different sizes with iso latency. Our evaluations, based on detailed SPICE simulations (https://github.com/uky-UCAT/AGNI_SPICE.git), show that AGNI can achieve savings of at least 8× in area, at least 28× energy-delay product (EDP), and at least 21 in area × latency, compared to two in-DRAM stochastic-to-binary conversion circuits from prior works. These circuit-level benefits are demonstrated to propagate at the system-level to achieve at least 3.9× gain in performance across four deep CNN models.
| Idioma original | English |
|---|---|
| Título de la publicación alojada | Proceedings of the 24th International Symposium on Quality Electronic Design, ISQED 2023 |
| ISBN (versión digital) | 9798350334753 |
| DOI | |
| Estado | Published - 2023 |
| Evento | 24th International Symposium on Quality Electronic Design, ISQED 2023 - San Francisco, United States Duración: abr 5 2023 → abr 7 2023 |
Serie de la publicación
| Nombre | Proceedings - International Symposium on Quality Electronic Design, ISQED |
|---|---|
| Volumen | 2023-April |
| ISSN (versión impresa) | 1948-3287 |
| ISSN (versión digital) | 1948-3295 |
Conference
| Conference | 24th International Symposium on Quality Electronic Design, ISQED 2023 |
|---|---|
| País/Territorio | United States |
| Ciudad | San Francisco |
| Período | 4/5/23 → 4/7/23 |
Nota bibliográfica
Publisher Copyright:© 2023 IEEE.
Financiación
We thank the anonymous reviewers for their valuable feedback. This research is supported by a grant from NSF (CNS- 2139167).
| Financiadores | Número del financiador |
|---|---|
| National Science Foundation Arctic Social Science Program | 2139167, CNS- 2139167 |
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
Huella
Profundice en los temas de investigación de 'AGNI: In-Situ, Iso-Latency Stochastic-to-Binary Number Conversion for In-DRAM Deep Learning'. En conjunto forman una huella única.Citar esto
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver