Capacitance analysis of a circular disk on a dielectric layer

Mimi X. Yang, Fuqian Yang

Producción científica: Articlerevisión exhaustiva

2 Citas (Scopus)

Resumen

Using the Hankel transform, the mixed boundary value problem of a conducting, circular disk on a dielectric layer in an electric field was reduced to the solution of dual integral equations. Analytical expressions of the capacitance of the electrical system to the second approximation were derived for the ratio of the layer thickness to the disk radius being larger than one and the ratio being less than one, respectively. Both expressions yield numerical results in accord with those reported in literature. The capacitance of a circular disk on a semi-infinite dielectric can be used for a ratio larger than or equal to 4. Using the results, the thickness effect on electrowetting of a disk-like conducting film on a dielectric substrate was discussed. There exists an upper bound of the electric voltage applied to the film above which the saturation of contact angle or local instability will occur.

Idioma originalEnglish
Páginas (desde-hasta)48-53
Número de páginas6
PublicaciónJournal of Electrostatics
Volumen76
DOI
EstadoPublished - ago 1 2015

Nota bibliográfica

Publisher Copyright:
© 2015 Elsevier B.V.

Financiación

MXY is grateful for the support of the NSF graduate fellowship.

FinanciadoresNúmero del financiador
National Science Foundation (NSF)

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Biotechnology
    • Condensed Matter Physics
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering

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