Resumen
X-ray powder diffraction (XRPD) profiles provide valuable information on the geometrical shape of crystallites. This work delves into the complexity of determining the geometrical shape of crystallites, including plate-like and spherical TiO2 specimens, and discusses crucial parameters of edge length, shape coefficient, and orientation vector. The analysis demonstrates the necessity of using both line-broadening analysis and preferred orientation to elucidate the underlying physics of XRPD analysis. The choice of empirical formula is illustrated in analyzing plate-like crystallites with the characteristic of flat morphology. For spherical crystallites, the March-Dollase formula is recommended.
| Idioma original | English |
|---|---|
| Número de artículo | 113812 |
| Publicación | Materials Characterization |
| Volumen | 210 |
| DOI | |
| Estado | Published - abr 2024 |
Nota bibliográfica
Publisher Copyright:© 2024 Elsevier Inc.
Financiación
TL is grateful for the support of National Natural Science Foundation of China ( 52301306 ). TL is grateful for the support of National Natural Science Foundation of China (52301306).TL is much indebted to Dr. Wanggang Zhang in Taiyuan University of Technology for the test of X-ray powder diffraction.
| Financiadores | Número del financiador |
|---|---|
| National Natural Science Foundation of China (NSFC) | 52301306 |
| National Natural Science Foundation of China (NSFC) | |
| Taiyuan University of Technology |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
Huella
Profundice en los temas de investigación de 'Comparative evaluation of line profile analysis and preferred orientation correction in determining crystallite shape of anatase with X-ray power diffraction profile'. En conjunto forman una huella única.Citar esto
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