Ellipsometric determination of the optical constants of C60 (Buckminsterfullerene) films

S. L. Ren; Y. Wang; A. M. Rao; E. McRae; J. M. Holden; T. Hager; Kai An Wang; Wen Tse Lee; H. F. Ni; J. Selegue; P. C. Eklund

doi:10.1063/1.105907

Ellipsometric determination of the optical constants of C₆₀ (Buckminsterfullerene) films

S. L. Ren, Y. Wang, A. M. Rao, E. McRae, J. M. Holden, T. Hager, Kai An Wang, Wen Tse Lee, H. F. Ni, J. Selegue, P. C. Eklund

Chemistry

Producción científica: Article › revisión exhaustiva

258 Citas (Scopus)

Resumen

We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C₆₀ films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital-lowest unoccupied molecular orbit (HOMO-LUMO) gap value of 2.3 eV, slightly larger than the gap values obtained from the x-ray photoelectron spectroscopy and electron-energy-loss spectroscopy experiments. The structure observed in the UV is discussed in terms of single-electron excitations across the HOMO-LUMO gap.

Idioma original	English
Páginas (desde-hasta)	2678-2680
Número de páginas	3
Publicación	Applied Physics Letters
Volumen	59
N.º	21
DOI	https://doi.org/10.1063/1.105907
Estado	Published - 1991

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.105907

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abstract = "We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C60 films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital-lowest unoccupied molecular orbit (HOMO-LUMO) gap value of 2.3 eV, slightly larger than the gap values obtained from the x-ray photoelectron spectroscopy and electron-energy-loss spectroscopy experiments. The structure observed in the UV is discussed in terms of single-electron excitations across the HOMO-LUMO gap.",

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doi = "10.1063/1.105907",

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T1 - Ellipsometric determination of the optical constants of C60 (Buckminsterfullerene) films

AU - Ren, S. L.

AU - Wang, Y.

AU - Rao, A. M.

AU - McRae, E.

AU - Holden, J. M.

AU - Hager, T.

AU - Wang, Kai An

AU - Lee, Wen Tse

AU - Ni, H. F.

AU - Selegue, J.

AU - Eklund, P. C.

PY - 1991

Y1 - 1991

N2 - We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C60 films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital-lowest unoccupied molecular orbit (HOMO-LUMO) gap value of 2.3 eV, slightly larger than the gap values obtained from the x-ray photoelectron spectroscopy and electron-energy-loss spectroscopy experiments. The structure observed in the UV is discussed in terms of single-electron excitations across the HOMO-LUMO gap.

AB - We report the first ellipsometric measurement of the fundamental optical constants (n,k) of C60 films deposited on Si(100) and Au overcoated Si(100) substrates. We obtain a highest occupied molecular orbital-lowest unoccupied molecular orbit (HOMO-LUMO) gap value of 2.3 eV, slightly larger than the gap values obtained from the x-ray photoelectron spectroscopy and electron-energy-loss spectroscopy experiments. The structure observed in the UV is discussed in terms of single-electron excitations across the HOMO-LUMO gap.

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VL - 59

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JO - Applied Physics Letters

JF - Applied Physics Letters

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