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Feature selection in pathology detection using hybrid multidimensional analysis

Producción científica: Conference contributionrevisión exhaustiva

7 Citas (Scopus)

Resumen

Heuristical algorithms can reduce the computational complexity. Such methods require of some stoping criteria (cost function). Some of these cost functions are based on statistics like univariate and multivariate methods of analysis. Dimensional reduction techniques such as Principal Component Analysis (PCA) allow to find a lower dimension transformed space based on data variance, but this procedure does not take into account information about classes separability, the direction of maximum variance does not necessarily correspond to the direction of maximum separability. In this work, we propose a feature selection algorithm with heuristic search that uses multivariate analysis of variance (MANOVA) as the cost function. This technique is put to test by classifying hypernasal from normal voices of CLP (Cleft Lip and/or Palate) patients. The classification performance, computational time and reduction ratio are also considered by the comparison with an alternate feature selection method founded on unfolding the multivariate analysis into univariate and bivariate analysis.

Idioma originalEnglish
Título de la publicación alojada28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06
Páginas5503-5506
Número de páginas4
DOI
EstadoPublished - 2006
Evento28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06 - New York, NY, United States
Duración: ago 30 2006sept 3 2006

Serie de la publicación

NombreAnnual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
ISSN (versión impresa)0589-1019

Conference

Conference28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06
País/TerritorioUnited States
CiudadNew York, NY
Período8/30/069/3/06

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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