Resumen
The indentation-induced growth of tin whiskers/hillocks was observed for the tin coatings over copper substrate. There existed multiple tin whiskers/hillocks surrounding the indents in contrast to only a few whiskers/hillocks in the nonindented area. The number of the tin whiskers surrounding the indents increased with the increase in the indentation load and decreased with the increase in the thickness of the tin coatings. The formation and growth of the tin whiskers were due to the pressure gradient at the contact edge, which is qualitatively in accord with the analysis for the indentation of thin coatings with a power-law flow behavior.
| Idioma original | English |
|---|---|
| Número de artículo | 113512 |
| Publicación | Journal of Applied Physics |
| Volumen | 104 |
| N.º | 11 |
| DOI | |
| Estado | Published - 2008 |
Nota bibliográfica
Funding Information:F.Y. is grateful to the Kentucky Science and Engineering Foundation for financial support of this work through Grant No. KSEF-148-502-06-180.
Financiación
F.Y. is grateful to the Kentucky Science and Engineering Foundation for financial support of this work through Grant No. KSEF-148-502-06-180.
| Financiadores | Número del financiador |
|---|---|
| Kentucky Science and Engineering Foundation | KSEF-148-502-06-180 |
ASJC Scopus subject areas
- General Physics and Astronomy
Huella
Profundice en los temas de investigación de 'Indentation-induced tin whiskers on electroplated tin coatings'. En conjunto forman una huella única.Citar esto
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