Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu; Behrang H. Hamadani; Hao Xiong; Sungkyu K. Park; Sankar Subramanian; Neil M. Zimmerman; John Anthony; Thomas N. Jackson; David J. Gundlach

doi:10.1109/ISDRS.2007.4422500

Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu, Behrang H. Hamadani, Hao Xiong, Sungkyu K. Park, Sankar Subramanian, Neil M. Zimmerman, John Anthony, Thomas N. Jackson, David J. Gundlach

Chemistry

Producción científica: Conference contribution › revisión exhaustiva

Idioma original	English
Título de la publicación alojada	2007 International Semiconductor Device Research Symposium, ISDRS
DOI	https://doi.org/10.1109/ISDRS.2007.4422500
Estado	Published - 2007
Evento	2007 International Semiconductor Device Research Symposium, ISDRS - College Park, MD, United States Duración: dic 12 2007 → dic 14 2007

Serie de la publicación

Nombre	2007 International Semiconductor Device Research Symposium, ISDRS

Conference

Conference	2007 International Semiconductor Device Research Symposium, ISDRS
País/Territorio	United States
Ciudad	College Park, MD
Período	12/12/07 → 12/14/07

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Acceder al documento

10.1109/ISDRS.2007.4422500

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Jurchescu, O. D., Hamadani, B. H., Xiong, H., Park, S. K., Subramanian, S., Zimmerman, N. M., Anthony, J., Jackson, T. N., & Gundlach, D. J. (2007). Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. En 2007 International Semiconductor Device Research Symposium, ISDRS Artículo 4422500 (2007 International Semiconductor Device Research Symposium, ISDRS). https://doi.org/10.1109/ISDRS.2007.4422500

@inproceedings{aae6f67381684aabac56b4cc4754fad3,

title = "Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors",

author = "Jurchescu, \{Oana D.\} and Hamadani, \{Behrang H.\} and Hao Xiong and Park, \{Sungkyu K.\} and Sankar Subramanian and Zimmerman, \{Neil M.\} and John Anthony and Jackson, \{Thomas N.\} and Gundlach, \{David J.\}",

year = "2007",

doi = "10.1109/ISDRS.2007.4422500",

language = "English",

isbn = "1424418917",

series = "2007 International Semiconductor Device Research Symposium, ISDRS",

booktitle = "2007 International Semiconductor Device Research Symposium, ISDRS",

note = "2007 International Semiconductor Device Research Symposium, ISDRS ; Conference date: 12-12-2007 Through 14-12-2007",

}

Jurchescu, OD, Hamadani, BH, Xiong, H, Park, SK, Subramanian, S, Zimmerman, NM, Anthony, J, Jackson, TN & Gundlach, DJ 2007, Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. En 2007 International Semiconductor Device Research Symposium, ISDRS., 4422500, 2007 International Semiconductor Device Research Symposium, ISDRS, 2007 International Semiconductor Device Research Symposium, ISDRS, College Park, MD, United States, 12/12/07. https://doi.org/10.1109/ISDRS.2007.4422500

Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. / Jurchescu, Oana D.; Hamadani, Behrang H.; Xiong, Hao et al.
2007 International Semiconductor Device Research Symposium, ISDRS. 2007. 4422500 (2007 International Semiconductor Device Research Symposium, ISDRS).

Producción científica: Conference contribution › revisión exhaustiva

TY - GEN

T1 - Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

AU - Jurchescu, Oana D.

AU - Hamadani, Behrang H.

AU - Xiong, Hao

AU - Park, Sungkyu K.

AU - Subramanian, Sankar

AU - Zimmerman, Neil M.

AU - Anthony, John

AU - Jackson, Thomas N.

AU - Gundlach, David J.

PY - 2007

Y1 - 2007

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U2 - 10.1109/ISDRS.2007.4422500

DO - 10.1109/ISDRS.2007.4422500

M3 - Conference contribution

AN - SCOPUS:44949186582

SN - 1424418917

SN - 9781424418916

T3 - 2007 International Semiconductor Device Research Symposium, ISDRS

BT - 2007 International Semiconductor Device Research Symposium, ISDRS

T2 - 2007 International Semiconductor Device Research Symposium, ISDRS

Y2 - 12 December 2007 through 14 December 2007

ER -

Jurchescu OD, Hamadani BH, Xiong H, Park SK, Subramanian S, Zimmerman NM et al. Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors. En 2007 International Semiconductor Device Research Symposium, ISDRS. 2007. 4422500. (2007 International Semiconductor Device Research Symposium, ISDRS). doi: 10.1109/ISDRS.2007.4422500

Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

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