Influence of the film microstructure on the electronic properties and flicker noise in organic thin film transistors

Oana D. Jurchescu, Behrang H. Hamadani, Hao Xiong, Sungkyu K. Park, Sankar Subramanian, Neil M. Zimmerman, John Anthony, Thomas N. Jackson, David J. Gundlach

Producción científica: Conference contribution › revisión exhaustiva

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Material Science