Ir directamente a la navegación principal Ir directamente a la búsqueda Ir directamente al contenido principal

Measuring FRET efficiency with phase lifetime

  • Daniel Sumetsky
  • , James Y. Jiang
  • , Marina Ayad
  • , Timothy Mahon
  • , Audrey Menaesse
  • , Marina M. Cararo-Lopes
  • , Mihir V. Patel
  • , Bonnie L. Firestein
  • , Nada N. Boustany

Producción científica: Conference articlerevisión exhaustiva

Resumen

A linear relationship between apparent EFRET app, based on phase lifetime, and EFRET true, based on sensitized emission, holds for modulation frequencies such that 1.1 and simplifies data acquisition and interpretation in FLIM-FRET.

Idioma originalEnglish
Número de artículoMTu4A.4
PublicaciónOptics InfoBase Conference Papers
EstadoPublished - 2022
EventoMicroscopy Histopathology and Analytics, Microscopy 2022 - Fort Lauderdale, United States
Duración: abr 24 2022abr 27 2022

Nota bibliográfica

Publisher Copyright:
© 2022 The Author(s).

Financiación

Acknowledgements: This study was supported by a NSF GOALI grant under award CMMI-1825433 to N.N.B and B.L.F. M.C.C. was supported by a Predoctoral Fellowship from CAPES, and M.P. was supported by NJCBIR Predoctoral Fellowship #CBIR15FEL009.

FinanciadoresNúmero del financiador
National Science FoundationCMMI-1825433
New Jersey Commission on Brain Injury Research15FEL009
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Mechanics of Materials

    Huella

    Profundice en los temas de investigación de 'Measuring FRET efficiency with phase lifetime'. En conjunto forman una huella única.

    Citar esto