TY - JOUR
T1 - Mechanical size-effects and dislocation dynamics in Cu thin films
AU - Dehm, Gerhard
AU - Edongue, Hervais
AU - John Balk, T.
AU - Arzt, Eduard
PY - 2003
Y1 - 2003
UR - https://www.scopus.com/pages/publications/0142123005
UR - https://www.scopus.com/pages/publications/0142123005#tab=citedBy
U2 - 10.1017/s1431927603023043
DO - 10.1017/s1431927603023043
M3 - Article
AN - SCOPUS:0142123005
SN - 1431-9276
VL - 9
SP - 246
EP - 247
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
IS - SUPPL. 3
ER -