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Modified montgomery modular multiplication using 4:2 Compressor and CSA adder

  • Himanshu Thapliyal
  • , Anvesh Ramasahayam
  • , Vivek Reddy Kotha
  • , Kunul Gottimukkula
  • , M. B. Srinivas

Producción científica: Conference contributionrevisión exhaustiva

11 Citas (Scopus)

Resumen

The efficiency of the Public Key encryption systems like RSA and ECC can be improved with the adoption of a faster multiplication scheme. In this paper, Modified Montgomery multiplications and circuit architectures are presented. The first modified Montgomery multiplier uses 4:2 compressor and carry save adders (CSA) to perform large word length additions. The total delay for a single modular multiplication using the proposed approach is 7XOR+1 AND gate compared to 8XOR+1AND gate of the recently proposed fastest algorithm. The second modified Montgomery multiplier uses a novel proposed hardware unit that outputs carry save representation of the 4-input operands in 3XOR delays. The total delay for a single modular multiplication using the novel hardware unit is 5XOR+1 AND gate compared to 6XOR+1AND gate of the recently proposed algorithm. The optimal transistor implementations of the proposed approaches have also been presented. The proposed transistor implementations are highly optimized in terms of area, speed and low power. The proposed Montgomery multiplication circuit will be of eminent importance when implemented for higher word length such as 1024 and 2048 as there will be saving in the propagation delays by 1024 and 2048 XOR gates respectively compared to the recently proposed fastest algorithm.

Idioma originalEnglish
Título de la publicación alojadaProceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
Páginas414-417
Número de páginas4
DOI
EstadoPublished - 2006
EventoThird IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006 - Kuala Lumpur, Malaysia
Duración: ene 17 2006ene 19 2006

Serie de la publicación

NombreProceedings - Third IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
Volumen2006

Conference

ConferenceThird IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2006
País/TerritorioMalaysia
CiudadKuala Lumpur
Período1/17/061/19/06

ASJC Scopus subject areas

  • General Engineering

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