Nonparametric flaw detection in large grained materials

N. M. Bilgutay; K. D. Donohue; X. Li

Nonparametric flaw detection in large grained materials

N. M. Bilgutay
, K. D. Donohue
, X. Li

Electrical and Computer Engineering

Producción científica: Conference article › revisión exhaustiva

1 Cita (Scopus)

Resumen

The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.

Idioma original	English
Páginas (desde-hasta)	1137-1141
Número de páginas	5
Publicación	Ultrasonics Symposium Proceedings
Volumen	2
Estado	Published - 1990
Evento	Proceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA Duración: dic 4 1990 → dic 7 1990

ASJC Scopus subject areas

General Engineering

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@article{c5c269e534794944bcff39f6ad5df241,

title = "Nonparametric flaw detection in large grained materials",

abstract = "The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.",

author = "Bilgutay, \{N. M.\} and Donohue, \{K. D.\} and X. Li",

year = "1990",

language = "English",

volume = "2",

pages = "1137--1141",

note = "Proceedings of the IEEE 1990 Ultrasonics Symposium ; Conference date: 04-12-1990 Through 07-12-1990",

}

TY - JOUR

T1 - Nonparametric flaw detection in large grained materials

AU - Bilgutay, N. M.

AU - Donohue, K. D.

AU - Li, X.

PY - 1990

Y1 - 1990

N2 - The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.

AB - The detection of targets embedded in dense microstructure scatterers using ultrasonic pulse-echo systems is examined. Split-spectrum processing (SSP) is presented as an efficient method for discriminating between target echoes and microstructure scattering based on differences between their RF phase patterns. The design of constant false-alarm thresholds is described for the F-test applied to RF SSP vectors. Experimental results are presented for A-scans from large-grain stainless-steel samples with flat-bottom holes.

UR - https://www.scopus.com/pages/publications/0025576365

UR - https://www.scopus.com/pages/publications/0025576365#tab=citedBy

M3 - Conference article

AN - SCOPUS:0025576365

SN - 0090-5607

VL - 2

SP - 1137

EP - 1141

JO - Ultrasonics Symposium Proceedings

JF - Ultrasonics Symposium Proceedings

T2 - Proceedings of the IEEE 1990 Ultrasonics Symposium

Y2 - 4 December 1990 through 7 December 1990

ER -

Nonparametric flaw detection in large grained materials

Resumen

ASJC Scopus subject areas

Otros archivos y enlaces

Huella

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