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On the location dependence of convolutional neural network features

  • Scott Workman
  • , Nathan Jacobs

Producción científica: Conference contributionrevisión exhaustiva

142 Citas (Scopus)

Resumen

As the availability of geotagged imagery has increased, so has the interest in geolocation-related computer vision applications, ranging from wide-area image geolocalization to the extraction of environmental data from social network imagery. Encouraged by the recent success of deep convolutional networks for learning high-level features, we investigate the usefulness of deep learned features for such problems. We compare features extracted from various layers of convolutional neural networks and analyze their discriminative ability with regards to location. Our analysis spans several problem settings, including region identification, visualizing land cover in aerial imagery, and ground-image localization in regions without ground-image reference data (where we achieve state-of-the-art performance on a benchmark dataset). We present results on multiple datasets, including a new dataset we introduce containing hundreds of thousands of ground-level and aerial images in a large region centered around San Francisco.

Idioma originalEnglish
Título de la publicación alojada2015 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2015
Páginas70-78
Número de páginas9
ISBN (versión digital)9781467367592
DOI
EstadoPublished - oct 19 2015
EventoIEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2015 - Boston, United States
Duración: jun 7 2015jun 12 2015

Serie de la publicación

NombreIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volumen2015-October
ISSN (versión impresa)2160-7508
ISSN (versión digital)2160-7516

Conference

ConferenceIEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2015
País/TerritorioUnited States
CiudadBoston
Período6/7/156/12/15

Nota bibliográfica

Publisher Copyright:
© 2015 IEEE.

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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