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Predicting autism diagnosis using image with fixations and synthetic saccade patterns

Producción científica: Conference contribution › revisión exhaustiva

28 Citas (Scopus)

Resumen

Signs of autism spectrum disorder (ASD) emerge in the first year of life in many children, but diagnosis is typically made much later, at an average age of 4 years in the United States. Early intervention is highly effective for young children with ASD, but is typically reserved for children with a formal diagnosis, making accurate identification as early as possible imperative. A screening tool that could identify ASD risk during infancy offers the opportunity for intervention before the full set of symptoms is present. In this paper, we propose two machine learning methods, synthetic saccade approach and image based approach, to automatically classify ASD given the scanpath data from children on free viewing of natural images. The first approach uses a generative model of synthetic saccade patterns to represent the baseline scan-path from a typical non-ASD individual and combines it with the input scanpath as well as other auxiliary data as inputs toa deep learning classifier. The second approach adopts a more holistic image based approach by feeding the input image and a sequence of fixation maps into a state-of-the-art convolutional neural network. Our experiments indicate that we can get 65.41% accuracy on the validation dataset.

Idioma originalEnglish
Título de la publicación alojadaProceedings - 2019 IEEE International Conference on Multimedia and Expo Workshops, ICMEW 2019
Páginas647-650
Número de páginas4
ISBN (versión digital)9781538692141
DOI
EstadoPublished - jul 2019
Evento2019 IEEE International Conference on Multimedia and Expo Workshops, ICMEW 2019 - Shanghai, China
Duración: jul 8 2019 → jul 12 2019

Serie de la publicación

NombreProceedings - 2019 IEEE International Conference on Multimedia and Expo Workshops, ICMEW 2019

Conference

Conference2019 IEEE International Conference on Multimedia and Expo Workshops, ICMEW 2019
País/TerritorioChina
CiudadShanghai
Período7/8/19 → 7/12/19

Nota bibliográfica

Publisher Copyright:
© 2019 IEEE.

ASJC Scopus subject areas

  • Media Technology
  • Computer Vision and Pattern Recognition

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