PROFILE METERS FOR DETAILED MEASUREMENT OF SOIL SURFACE HEIGHTS.

M. C. Hirschi; B. J. Barfield; I. D. Moore; D. G. Colliver

PROFILE METERS FOR DETAILED MEASUREMENT OF SOIL SURFACE HEIGHTS.

M. C. Hirschi
, B. J. Barfield
, I. D. Moore
, D. G. Colliver

Producción científica: Article › revisión exhaustiva

12 Citas (Scopus)

Resumen

Two surface profile meters were developed for use in soil erosion research. Both were designed for use on 4. 6 m wide field plots. Surface heights were measured electronically and stored on floppy disks. Meter pin spacing of 6. 4 cm and 1. 3 cm allowed measurement of plot characteristics and rill cross-sections. The accuracy of the meters was determined to be better than plus or minus 1 mm. Design criteria, circuitry, and performance data are presented.

Idioma original	English
Páginas (desde-hasta)	47-51
Número de páginas	5
Publicación	Applied Engineering in Agriculture
Volumen	3
N.º	1
Estado	Published - may 1987

ASJC Scopus subject areas

General Engineering

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abstract = "Two surface profile meters were developed for use in soil erosion research. Both were designed for use on 4. 6 m wide field plots. Surface heights were measured electronically and stored on floppy disks. Meter pin spacing of 6. 4 cm and 1. 3 cm allowed measurement of plot characteristics and rill cross-sections. The accuracy of the meters was determined to be better than plus or minus 1 mm. Design criteria, circuitry, and performance data are presented.",

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AU - Hirschi, M. C.

AU - Barfield, B. J.

AU - Moore, I. D.

AU - Colliver, D. G.

PY - 1987/5

Y1 - 1987/5

N2 - Two surface profile meters were developed for use in soil erosion research. Both were designed for use on 4. 6 m wide field plots. Surface heights were measured electronically and stored on floppy disks. Meter pin spacing of 6. 4 cm and 1. 3 cm allowed measurement of plot characteristics and rill cross-sections. The accuracy of the meters was determined to be better than plus or minus 1 mm. Design criteria, circuitry, and performance data are presented.

AB - Two surface profile meters were developed for use in soil erosion research. Both were designed for use on 4. 6 m wide field plots. Surface heights were measured electronically and stored on floppy disks. Meter pin spacing of 6. 4 cm and 1. 3 cm allowed measurement of plot characteristics and rill cross-sections. The accuracy of the meters was determined to be better than plus or minus 1 mm. Design criteria, circuitry, and performance data are presented.

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UR - https://www.scopus.com/pages/publications/0023345543#tab=citedBy

M3 - Article

AN - SCOPUS:0023345543

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JO - Applied Engineering in Agriculture

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PROFILE METERS FOR DETAILED MEASUREMENT OF SOIL SURFACE HEIGHTS.

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Huella

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