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Resistance spot welding of 50Mo-50Re refractory alloy foils

  • John Farrell
  • , William Umstead
  • , Jianhui Xu
  • , T. Zhai

Producción científica: Conference contributionrevisión exhaustiva

3 Citas (Scopus)

Resumen

The use of 50Mo-50Re foil materials (<.010" thickness) as heat shielding and in structural support applications for the microwave tube industry are well documented. A common fabrication and processing method for components and assemblies is resistance spot welding (RSW). There are many parameters employed in the welding processing: weld current, weld time, electrode force, hold time, squeeze time, electrode material, electrode geometry, electric polarity, surface roughness, cover gas, et al. In this study, an attempt is made to improve the RSW quality of 50Mo-50Re refractory foils and to understand the typical characteristics of RSW 50Mo-50Re alloys used in high power cathode assembly applications. Pairs of 50Mo-50Re samples with a lap-shear geometry were welded using a Unitek Model DC25 linear DC resistance welder. Tensile-shear tests of the welded samples were conducted on a Instron Series IX Testing System with a 0.2 mm/min tension rate at room temperature. Peak load measured was regarded as the strength of the weldment and was obtained from the average value of several samples. The characteristics of the welds were examined by optical microscopy and SEM. EDS was used to look at the chemical makeup of some weld areas.

Idioma originalEnglish
Título de la publicación alojada2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC
Páginas340-341
Número de páginas2
DOI
EstadoPublished - 2008
Evento2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC - Monterey, CA, United States
Duración: abr 22 2008abr 24 2008

Serie de la publicación

Nombre2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC

Conference

Conference2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC
País/TerritorioUnited States
CiudadMonterey, CA
Período4/22/084/24/08

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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