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SaR: Self-adaptive Refinement on Pseudo Labels for Multiclass-Imbalanced Semi-supervised Learning

Producción científica: Conference contributionrevisión exhaustiva

24 Citas (Scopus)

Resumen

Class-imbalanced datasets can severely deteriorate the performance of semi-supervised learning (SSL). This is due to the confirmation bias especially when the pseudo labels are highly biased towards the majority classes. Traditional resampling or reweighting techniques may not be directly applicable when the unlabeled data distribution is unknown. Inspired by the threshold-moving method that performs well in supervised learning-based binary classification tasks, we provide a simple yet effective scheme to address the multiclass imbalance issue of SSL. This scheme, named SaR, is a Self-adaptive Refinement of soft labels before generating pseudo labels. The pseudo labels generated post-SaR will be less biased, resulting in higher quality data for training the classifier. We show that SaR can consistently improve recent consistency-based SSL algorithms on various image classification problems across different imbalanced ratios. We also show that SaR is robust to the situations where unlabeled data have different distributions as labeled data. Hence, SaR does not rely on the assumptions that unlabeled data share the same distribution as the labeled data.

Idioma originalEnglish
Título de la publicación alojadaProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Páginas4090-4099
Número de páginas10
ISBN (versión digital)9781665487399
DOI
EstadoPublished - 2022
Evento2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Duración: jun 19 2022jun 20 2022

Serie de la publicación

NombreIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volumen2022-June
ISSN (versión impresa)2160-7508
ISSN (versión digital)2160-7516

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
País/TerritorioUnited States
CiudadNew Orleans
Período6/19/226/20/22

Nota bibliográfica

Publisher Copyright:
© 2022 IEEE.

Financiación

*Equal contributions. This work was supported by the NSF HDR:TRIPODS grant CCF-1934568.

FinanciadoresNúmero del financiador
U.S. Department of Energy Chinese Academy of Sciences Guangzhou Municipal Science and Technology Project Oak Ridge National Laboratory Extreme Science and Engineering Discovery Environment National Science Foundation National Energy Research Scientific Computing Center National Natural Science Foundation of ChinaCCF-1934568
U.S. Department of Energy Chinese Academy of Sciences Guangzhou Municipal Science and Technology Project Oak Ridge National Laboratory Extreme Science and Engineering Discovery Environment National Science Foundation National Energy Research Scientific Computing Center National Natural Science Foundation of China

    ASJC Scopus subject areas

    • Computer Vision and Pattern Recognition
    • Electrical and Electronic Engineering

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