Spatial relation between NDVI and grain yield: Impact of spatial resolution and measurement device
- O. Wendroth
- , A. Giebel
- , E. Pena-Yewtukhiw
- , K. C. Kersebaum
- , G. J. Schwab
- , H. I. Reuter
- , L. W. Murdock
- , T. S. Stombaugh
Producción científica: Conference contribution › revisión exhaustiva
1
Cita
(Scopus)