Thermal resistances of thin films of small molecule organic semiconductors

Y. Yao; Maryam Shahi; Marcia M. Payne; J. E. Anthony; J. W. Brill

doi:10.1039/c6tc03569h

Thermal resistances of thin films of small molecule organic semiconductors

Y. Yao
, Maryam Shahi
, Marcia M. Payne
, J. E. Anthony
, J. W. Brill

Producción científica: Article › revisión exhaustiva

12 Citas (Scopus)

Resumen

We have measured the thermal resistances of thin films of the small molecule organic semiconductors bis(triisopropylsilylethynyl) pentacene (TIPS-pn), bis(triethylsilylethynyl) anthradithiophene (TES-ADT) and difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TES-ADT). For each material, several films of different thicknesses have been measured to separate the effects of intrinsic thermal conductivity from interface thermal resistance. For sublimed films of TIPS-pn and diF-TES-ADT, with thicknesses ranging from <100 nm to >4 μm, the thermal conductivities are similar to those of polymers and over an order of magnitude smaller than those of single crystals, presumably reflecting the large reduction in phonon mean-free path in the films. For thin (≤205 nm) crystalline films of TES-ADT, prepared by vapor-annealing spin-cast films, the thermal resistances are dominated by interface scattering.

Idioma original	English
Páginas (desde-hasta)	8817-8821
Número de páginas	5
Publicación	Journal of Materials Chemistry C
Volumen	4
N.º	37
DOI	https://doi.org/10.1039/c6tc03569h
Estado	Published - 2016

Nota bibliográfica

Publisher Copyright:
© 2016 The Royal Society of Chemistry.

Financiación

Financiadores	Número del financiador
U.S. Department of Energy Chinese Academy of Sciences Guangzhou Municipal Science and Technology Project Oak Ridge National Laboratory Extreme Science and Engineering Discovery Environment National Science Foundation National Energy Research Scientific Computing Center National Natural Science Foundation of China	1262261

ASJC Scopus subject areas

General Chemistry
Materials Chemistry

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title = "Thermal resistances of thin films of small molecule organic semiconductors",

abstract = "We have measured the thermal resistances of thin films of the small molecule organic semiconductors bis(triisopropylsilylethynyl) pentacene (TIPS-pn), bis(triethylsilylethynyl) anthradithiophene (TES-ADT) and difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TES-ADT). For each material, several films of different thicknesses have been measured to separate the effects of intrinsic thermal conductivity from interface thermal resistance. For sublimed films of TIPS-pn and diF-TES-ADT, with thicknesses ranging from <100 nm to >4 μm, the thermal conductivities are similar to those of polymers and over an order of magnitude smaller than those of single crystals, presumably reflecting the large reduction in phonon mean-free path in the films. For thin (≤205 nm) crystalline films of TES-ADT, prepared by vapor-annealing spin-cast films, the thermal resistances are dominated by interface scattering.",

author = "Y. Yao and Maryam Shahi and Payne, \{Marcia M.\} and Anthony, \{J. E.\} and Brill, \{J. W.\}",

note = "Publisher Copyright: {\textcopyright} 2016 The Royal Society of Chemistry.",

year = "2016",

doi = "10.1039/c6tc03569h",

language = "English",

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pages = "8817--8821",

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T1 - Thermal resistances of thin films of small molecule organic semiconductors

AU - Yao, Y.

AU - Shahi, Maryam

AU - Payne, Marcia M.

AU - Anthony, J. E.

AU - Brill, J. W.

PY - 2016

Y1 - 2016

N2 - We have measured the thermal resistances of thin films of the small molecule organic semiconductors bis(triisopropylsilylethynyl) pentacene (TIPS-pn), bis(triethylsilylethynyl) anthradithiophene (TES-ADT) and difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TES-ADT). For each material, several films of different thicknesses have been measured to separate the effects of intrinsic thermal conductivity from interface thermal resistance. For sublimed films of TIPS-pn and diF-TES-ADT, with thicknesses ranging from <100 nm to >4 μm, the thermal conductivities are similar to those of polymers and over an order of magnitude smaller than those of single crystals, presumably reflecting the large reduction in phonon mean-free path in the films. For thin (≤205 nm) crystalline films of TES-ADT, prepared by vapor-annealing spin-cast films, the thermal resistances are dominated by interface scattering.

AB - We have measured the thermal resistances of thin films of the small molecule organic semiconductors bis(triisopropylsilylethynyl) pentacene (TIPS-pn), bis(triethylsilylethynyl) anthradithiophene (TES-ADT) and difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TES-ADT). For each material, several films of different thicknesses have been measured to separate the effects of intrinsic thermal conductivity from interface thermal resistance. For sublimed films of TIPS-pn and diF-TES-ADT, with thicknesses ranging from <100 nm to >4 μm, the thermal conductivities are similar to those of polymers and over an order of magnitude smaller than those of single crystals, presumably reflecting the large reduction in phonon mean-free path in the films. For thin (≤205 nm) crystalline films of TES-ADT, prepared by vapor-annealing spin-cast films, the thermal resistances are dominated by interface scattering.

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U2 - 10.1039/c6tc03569h

DO - 10.1039/c6tc03569h

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AN - SCOPUS:84988698771

SN - 2050-7534

VL - 4

SP - 8817

EP - 8821

JO - Journal of Materials Chemistry C

JF - Journal of Materials Chemistry C

IS - 37

ER -

Thermal resistances of thin films of small molecule organic semiconductors

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