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Universal phase unwrapping for phase measuring profilometry using geometry analysis

Producción científica: Conference contributionrevisión exhaustiva

2 Citas (Scopus)

Resumen

Traditionally temporal phase unwrapping for phase measuring profilometry needs to employ the phase computed from unit-frequency patterned images; however, it has recently been reported that two phases with co-prime frequencies can be absolutely unwrapped each other. However, a manually man-made look-up table for two known frequencies has to be used for correctly unwrapping phases. If two co-prime frequencies are changed, the look-up table has to be manually rebuilt. In this paper, a universal phase unwrapping algorithm is proposed to unwrap phase flexibly and automatically. The basis of the proposed algorithm is converting a signal-processing problem into a geometric analysis one. First, we normalize two wrapped phases such that they are of the same needed slope. Second, by using the modular operation, we unify the integer-valued difference of the two normalized phases over each wrapping interval. Third, by analyzing the properties of the uniform difference mathematically, we can automatically build a look-up table to record the corresponding correct orders for all wrapping intervals. Even if the frequencies are changed, the look-up table will be automatically updated for the latest involved frequencies. Finally, with the order information stored in the look-up table, the wrapped phases can be correctly unwrapped. Both simulations and experimental results verify the correctness of the proposed algorithm.

Idioma originalEnglish
Título de la publicación alojadaEmerging Digital Micromirror Device Based Systems and Applications X
EditoresBenjamin L. Lee, Michael R. Douglass
ISBN (versión digital)9781510615779
DOI
EstadoPublished - 2018
EventoEmerging Digital Micromirror Device Based Systems and Applications X 2018 - San Francisco, United States
Duración: ene 29 2018ene 30 2018

Serie de la publicación

NombreProceedings of SPIE - The International Society for Optical Engineering
Volumen10546
ISSN (versión impresa)0277-786X
ISSN (versión digital)1996-756X

Conference

ConferenceEmerging Digital Micromirror Device Based Systems and Applications X 2018
País/TerritorioUnited States
CiudadSan Francisco
Período1/29/181/30/18

Nota bibliográfica

Publisher Copyright:
© 2018 SPIE.

Financiación

This work was supported, in part, by the National Natural Science Foundation of China (#61473198) and by the Science and Technology Support Program of Sichuan Province, China (#18ZDYF1655).

FinanciadoresNúmero del financiador
Sichuan Province Science and Technology Support Program18ZDYF1655
National Natural Science Foundation of China (NSFC)61473198

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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